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%%%% 216533:216886
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\名称{マイクロ$\cdot{}$ナノ工学}{Micro-Nano Engineering}%
\担当教員{\所属肩書氏名{知的力学システム工学専攻 機械創造システム工学コース 機械科学講座}{教授}{\EdbSMG{岩田}{}{哲郎}}}%
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\履修種別{選択}%
\EdbColDef{edb:lecture.goal}{1}{E}{To understand x-ray diffraction method and its application for material science}%
\EdbColDef{edb:lecture.goal}{1}{J}{X線回折手法の習得と材料創生$\cdot{}$評価への応用}%
\EdbColDef{edb:lecture.goal}{2}{E}{To understand scientific measurements and instrumentation technology}%
\EdbColDef{edb:lecture.goal}{2}{J}{科学計測機器の設計$\cdot{}$製作能力の育成}%
\EdbColDef{edb:lecture.plan}{1}{E}{Basics of X-rays}%
\EdbColDef{edb:lecture.plan}{1}{J}{X線の基本的性質}%
\EdbColDef{edb:lecture.plan}{2}{E}{Lattices and crystal structures}%
\EdbColDef{edb:lecture.plan}{2}{J}{結晶の幾何学}%
\EdbColDef{edb:lecture.plan}{3}{E}{Crystal axes and reciprocal lattice}%
\EdbColDef{edb:lecture.plan}{3}{J}{実格子と逆格子}%
\EdbColDef{edb:lecture.plan}{4}{E}{Scattering by an atom}%
\EdbColDef{edb:lecture.plan}{4}{J}{原子による散乱強度}%
\EdbColDef{edb:lecture.plan}{5}{E}{Diffraction by small crystal}%
\EdbColDef{edb:lecture.plan}{5}{J}{小さな結晶からの回折と積分強度}%
\EdbColDef{edb:lecture.plan}{6}{E}{Kinds of residual stresses}%
\EdbColDef{edb:lecture.plan}{6}{J}{残留応力の種類}%
\EdbColDef{edb:lecture.plan}{7}{E}{X-ray stress measurement}%
\EdbColDef{edb:lecture.plan}{7}{J}{X線応力測定法}%
\EdbColDef{edb:lecture.plan}{8}{E}{Instruments for scientific measurements}%
\EdbColDef{edb:lecture.plan}{8}{J}{科学計測機器と計測手法}%
\EdbColDef{edb:lecture.plan}{9}{E}{Instrumental methods for chemical analysis}%
\EdbColDef{edb:lecture.plan}{9}{J}{分析機器と分析手法}%
\EdbColDef{edb:lecture.plan}{10}{E}{Microscopy and near-field optics}%
\EdbColDef{edb:lecture.plan}{10}{J}{顕微鏡と近接場光学}%
\EdbColDef{edb:lecture.plan}{11}{E}{Analytical instruments 1}%
\EdbColDef{edb:lecture.plan}{11}{J}{分析機器概論1}%
\EdbColDef{edb:lecture.plan}{12}{E}{Analytical instruments 2}%
\EdbColDef{edb:lecture.plan}{12}{J}{分析機器概論2}%
\EdbColDef{edb:lecture.plan}{13}{E}{Electronics for scientific measurements}%
\EdbColDef{edb:lecture.plan}{13}{J}{科学計測のための電子回路}%
\EdbColDef{edb:lecture.plan}{14}{E}{Data-processing method for scientific measurements}%
\EdbColDef{edb:lecture.plan}{14}{J}{科学計測のためのデータ処理}%
\EdbColDef{edb:lecture.plan}{15}{E}{System design for scientific measurements}%
\EdbColDef{edb:lecture.plan}{15}{J}{科学計測のためのシステム設計}%
\EdbColDef{edb:lecture.plan}{16}{E}{Report and presentation}%
\EdbColDef{edb:lecture.plan}{16}{J}{レポートとプレゼンテーション}%
\EdbColDef{edb:lecture.style}{1}{@}{132702}%
\EdbColDef{edb:lecture.style}{1}{E}{Portfolio}%
\EdbColDef{edb:lecture.style}{1}{J}{ポートフォーリオ}%
\EdbColDef{edb:lecture.unit}{1}{E}{2}%
\EdbColDef{edb:lecture.unit}{1}{J}{2}%
\EdbColDef{edb:lecture.target}{1}{E}{This class introduces mesurement techniques and instruments for analyzing and developing new materials.}%
\EdbColDef{edb:lecture.target}{1}{J}{新材料の創生と応用のため，材料の局所領域評価とそのための手法および装置の設計$\cdot{}$製作に関する研究能力を育成すること}%
\EdbColDef{edb:lecture.outline}{1}{E}{Prof.\ Hanabusa lectures on the method of materials evaluation by means of X-ray diffraction: Principle of X-ray diffraction, macro and micro lattice strains, and residual stress measurement.\ Prof.\ Iwata reviews instrumental methods for extracting information on materials using optical and spectroscopic techniques: Scientific measurements, data processing, and instrumentation for chemical analysis.}%
\EdbColDef{edb:lecture.outline}{1}{J}{X線および光学的手法を用いて材料の結晶構造および微視的格子ひずみ，あるいは物質情報を抽出する手法，さらに結晶のミクロ$\cdot{}$ナノ的構造とマクロ的性質の関係を基本とした新材料の創製$\cdot{}$評価および応用，またそのための装置設計$\cdot{}$製作に関する事項を講述する． (英 崇夫教授)X線回折法を利用した材料の結晶構造解析および格子ひずみ解析をとおして，新材料を創成$\cdot{}$評価する手法の講義を担当する． (岩田哲郎教授)光学，分光学の手法を用いた物質情報の抽出手法，また，そのための計測機器，分析機器などの測定装置の設計と評価方法についての講義を担当する．科学計測学全般についても講述する．}%
\EdbColDef{edb:lecture.keyword}{1}{E}{X-ray structure analysis}%
\EdbColDef{edb:lecture.keyword}{1}{J}{X線構造解析}%
\EdbColDef{edb:lecture.keyword}{2}{E}{scientific measurements}%
\EdbColDef{edb:lecture.keyword}{2}{J}{科学計測}%
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\EdbColDef{edb:lecture.requirement}{1}{E}{Students are required to have a good understanging of undergraduate-level related subjects.}%
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\EdbColDef{edb:lecture.evaluation}{1}{E}{Assinments counts 100\%.}%
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\EdbColDef{edb:lecture.textbook}{1}{E}{To be introduced in the class.}%
\EdbColDef{edb:lecture.textbook}{1}{J}{授業中に紹介する．}%
\EdbColDef{edb:lecture.reference}{1}{E}{To be introduced in the class.}%
\EdbColDef{edb:lecture.reference}{1}{J}{授業中に紹介する．}%
\EdbColDef{edb:lecture.contact}{1}{J}{\連絡先個人{\EdbEMAIL{iwata@me.tokushima-u.ac.jp}{i{\HZSp[1]}w{\HZSp[1]}a{\HZSp[1]}t{\HZSp[1]}a{\HZSp[1]}@{\HZSp[1]}m{\HZSp[1]}e{\HZSp[1]}.{\HZSp[1]}t{\HZSp[1]}o{\HZSp[1]}k{\HZSp[1]}u{\HZSp[1]}s{\HZSp[1]}h{\HZSp[1]}i{\HZSp[1]}m{\HZSp[1]}a{\HZSp[1]}-{\HZSp[1]}u{\HZSp[1]}.{\HZSp[1]}a{\HZSp[1]}c{\HZSp[1]}.{\HZSp[1]}j{\HZSp[1]}p}}{岩田 (M427, 088-656-9743, \EdbEMAIL{iwata@me.tokushima-u.ac.jp}{i{\HZSp[1]}w{\HZSp[1]}a{\HZSp[1]}t{\HZSp[1]}a{\HZSp[1]}@{\HZSp[1]}m{\HZSp[1]}e{\HZSp[1]}.{\HZSp[1]}t{\HZSp[1]}o{\HZSp[1]}k{\HZSp[1]}u{\HZSp[1]}s{\HZSp[1]}h{\HZSp[1]}i{\HZSp[1]}m{\HZSp[1]}a{\HZSp[1]}-{\HZSp[1]}u{\HZSp[1]}.{\HZSp[1]}a{\HZSp[1]}c{\HZSp[1]}.{\HZSp[1]}j{\HZSp[1]}p})}{}}%
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%%%% 216533:216886
\begin{edb:lecture}%
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\EdbColDef{edb:lecture.goal}{1}{J}{X線回折手法の習得と材料創生$\cdot{}$評価への応用}%
\EdbColDef{edb:lecture.goal}{1}{E}{To understand x-ray diffraction method and its application for material science}%
\EdbColDef{edb:lecture.goal}{2}{J}{科学計測機器の設計$\cdot{}$製作能力の育成}%
\EdbColDef{edb:lecture.goal}{2}{E}{To understand scientific measurements and instrumentation technology}%
\EdbColDef{edb:lecture.plan}{1}{J}{X線の基本的性質}%
\EdbColDef{edb:lecture.plan}{1}{E}{Basics of X-rays}%
\EdbColDef{edb:lecture.plan}{2}{J}{結晶の幾何学}%
\EdbColDef{edb:lecture.plan}{2}{E}{Lattices and crystal structures}%
\EdbColDef{edb:lecture.plan}{3}{J}{実格子と逆格子}%
\EdbColDef{edb:lecture.plan}{3}{E}{Crystal axes and reciprocal lattice}%
\EdbColDef{edb:lecture.plan}{4}{J}{原子による散乱強度}%
\EdbColDef{edb:lecture.plan}{4}{E}{Scattering by an atom}%
\EdbColDef{edb:lecture.plan}{5}{J}{小さな結晶からの回折と積分強度}%
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\EdbColDef{edb:lecture.plan}{13}{J}{科学計測のための電子回路}%
\EdbColDef{edb:lecture.plan}{13}{E}{Electronics for scientific measurements}%
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\EdbColDef{edb:lecture.target}{1}{E}{This class introduces mesurement techniques and instruments for analyzing and developing new materials.}%
\EdbColDef{edb:lecture.outline}{1}{J}{X線および光学的手法を用いて材料の結晶構造および微視的格子ひずみ，あるいは物質情報を抽出する手法，さらに結晶のミクロ$\cdot{}$ナノ的構造とマクロ的性質の関係を基本とした新材料の創製$\cdot{}$評価および応用，またそのための装置設計$\cdot{}$製作に関する事項を講述する． (英 崇夫教授)X線回折法を利用した材料の結晶構造解析および格子ひずみ解析をとおして，新材料を創成$\cdot{}$評価する手法の講義を担当する． (岩田哲郎教授)光学，分光学の手法を用いた物質情報の抽出手法，また，そのための計測機器，分析機器などの測定装置の設計と評価方法についての講義を担当する．科学計測学全般についても講述する．}%
\EdbColDef{edb:lecture.outline}{1}{E}{Prof.\ Hanabusa lectures on the method of materials evaluation by means of X-ray diffraction: Principle of X-ray diffraction, macro and micro lattice strains, and residual stress measurement.\ Prof.\ Iwata reviews instrumental methods for extracting information on materials using optical and spectroscopic techniques: Scientific measurements, data processing, and instrumentation for chemical analysis.}%
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\EdbColDef{edb:lecture.evaluation}{1}{J}{授業最終日に課すレポートで評価する．}%
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\EdbColDef{edb:lecture.textbook}{1}{E}{To be introduced in the class.}%
\EdbColDef{edb:lecture.reference}{1}{J}{授業中に紹介する．}%
\EdbColDef{edb:lecture.reference}{1}{E}{To be introduced in the class.}%
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\end{document}
